ICR HH100-6 set
Near-Field Microprobe 2.5 MHz – 6 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed:
• Surface Scan via IC according to IEC 61967-3
• Volumenscan via IC
• Pin Scan
The measuring coil at the ICR RF probe head is horizontally aligned to the measurement surface.
A preamplifier is integrated into the probe housing and powered by the Bias-Tee.
The ICR near-field probes undergo a quality check before they are delivered. Different reference setup measurements are performed and resulting correction lines are generated. Two different correction lines are determined – a standardized correction line and an H-field correction line.
Attention: Due to its construction, the ICR probe is sensitive to shock and comes with a protective cap for transport and handling.
ICR HH100-27 set
Near-Field Microprobe 1.5 MHz – 6 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed:
• Surface Scan via IC according to IEC 61967-3
• Volumenscan via IC
• Pin Scan
The measuring coil at the ICR RF probe head is horizontally aligned to the measurement surface.
A preamplifier is integrated in the probe housing and is supplied by the enclosed bias tee.
The ICR near-field probes undergo a quality check before they are delivered. Different reference setup measurements are performed and resulting correction lines are generated. Two different correction lines are determined – a standardized correction line and an H-field correction line.
Attention: Due to its construction, the ICR probe is sensitive to shock and comes with a protective cap for transport and handling.
ICR HH150-6 set
Near-Field Microprobe 2.5 MHz – 6 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed:
• Surface Scan via IC according to IEC 61967-3
• Volumenscan via IC
• Pin Scan
The measuring coil at the ICR RF probe head is horizontally aligned to the measurement surface.
A preamplifier is integrated into the probe housing and powered by the Bias-Tee.
The ICR near-field probes undergo a quality check before they are delivered. Different reference setup measurements are performed and resulting correction lines are generated. Two different correction lines are determined – a standardized correction line and an H-field correction line.
Attention: Due to its construction, the ICR probe is sensitive to shock and comes with a protective cap for transport and handling.
ICR HH150-27 set
Near-Field Microprobe 1.5 MHz – 6 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed:
• Surface Scan via IC according to IEC 61967-3
• Volumenscan via IC
• Pin Scan
The measuring coil at the ICR RF probe head is horizontally aligned to the measurement surface.
A preamplifier is integrated into the probe housing and powered by the Bias-Tee.
The ICR near-field probes undergo a quality check before they are delivered. Different reference setup measurements are performed and resulting correction lines are generated. Two different correction lines are determined – a standardized correction line and an H-field correction line.
Attention: Due to its construction, the ICR probe is sensitive to shock and comes with a protective cap for transport and handling.
ICR HH250-6 set
Near-Field Microprobe 2.5 MHz – 6 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed:
• Surface Scan via IC according to IEC 61967-3
• Volumenscan via IC
• Pin Scan
The measuring coil at the ICR RF probe head is horizontally aligned to the measurement surface.
A preamplifier is integrated into the probe housing and powered by the Bias-Tee.
The ICR near-field probes undergo a quality check before they are delivered. Different reference setup measurements are performed and resulting correction lines are generated. Two different correction lines are determined – a standardized correction line and an H-field correction line.
Attention: Due to its construction, the ICR probe is sensitive to shock and comes with a protective cap for transport and handling.
ICR HH250-75 set
Near-Field Microprobe 0.5 MHz – 2 GHz
The near-field microprobe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed:
• Surface Scan via IC according to IEC 61967-3
• Volumenscan via IC
• Pin Scan
The measuring coil at the ICR RF probe head is horizontally aligned to the measurement surface.
A preamplifier is integrated into the probe housing and powered by the Bias-Tee.
The ICR near-field probes undergo a quality check before they are delivered. Different reference setup measurements are performed and resulting correction lines are generated. Two different correction lines are determined – a standardized correction line and an H-field correction line.
Attention: Due to its construction, the ICR probe is sensitive to shock and comes with a protective cap for transport and handling.
ICR HH500-6 set
Near-Field Microprobe 2 MHz – 6 GHz
The probe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed:
• Surface Scan via IC according to IEC 61967-3
• Volumenscan via IC
• Pin Scan
The measuring coil at the ICR RF probe head is horizontally aligned to the measurement surface.
A preamplifier is integrated into the probe housing and powered by the Bias-Tee.
The ICR near-field probes undergo a quality check before they are delivered. Different reference setup measurements are performed and resulting correction lines are generated. Two different correction lines are determined – a standardized correction line and an H-field correction line.
Attention: Due to its construction, the ICR probe is sensitive to shock and comes with a protective cap for transport and handling.
ICR HH500-75 set
Near-Field Microprobe 200 kHz – 1 GHz
The probe is designed for a high-resolution measurement of magnetic near fields. With the ICR H probe the following measurements can be performed:
• Surface Scan via IC according to IEC 61967-3
• Volumenscan via IC
• Pin Scan
The measuring coil at the ICR RF probe head is horizontally aligned to the measurement surface.
A preamplifier is integrated into the probe housing and powered by the Bias-Tee.
The ICR near-field probes undergo a quality check before they are delivered. Different reference setup measurements are performed and resulting correction lines are generated. Two different correction lines are determined – a standardized correction line and an H-field correction line.
Attention: Due to its construction, the ICR probe is sensitive to shock and comes with a protective cap for transport and handling.
Comparison of Measurement Resolution and Frequency Ranges:
| Type of Probe (HH) | Inner Diameter | Frequency range | Measurement Resolution |
| ICR HH100-27 | 100 µm | 1.5 MHz – 6 GHz | 70 µm |
| ICR HH100-6 | 2.5 MHz – 6 GHz | ||
| ICR HH150-27 | 150 µm | 1.5 MHz – 6 GHz | 100 µm |
| ICR HH150-6 | 2.5 MHz – 6 GHz | ||
| ICR HH250-75 | 250 µm | 500 kHz – 2 GHz | 150 µm |
| ICR HH250-6 | 2.5 MHz – 6 GHz | ||
| ICR HH500-75 | 500 µm | 200 kHz – 1 GHz | 300 µm |
| ICR HH500-6 | 2 MHz – 6 GHz |
Probes named with ICR HHxxx-27/-75 are characterized by a higher gain in the lower frequency range.
Frequency response HH250-75 up to 2 GHz.
Frequency response HH500-75 up to 1 GHz.
Downloads:
ICR Near-Field Microprobes overview
Overview Description Dimensions of ICR probes (PDF, 1.11 MB)