ICR E150 set

ICR E150 set

Near-Field Microprobe E-field 7 MHz up to 3 GHz
The near-field microprobe is designed for a high-resolution measurement of electrical near fields. With the ICR E probe the following measurements can be performed:
• Surface Scan via IC according to IEC 61967-3
• Volumenscan via IC
• Pin Scan
Downloads

Overview Description Dimensions of ICR probes (PDF, 1.11 MB)

The measuring electrode at the ICR RF probe head is horizontally aligned to the measurement surface.
A preamplifier is integrated into the probe housing and powered by the enclosed Bias-Tee.
The ICR near-field probes undergo a quality check before they are delivered. Different reference setup measurements are performed and resulting correction lines are generated. Two different correction lines are determined – a standardized correction line and an E-field correction line.

Attention: Due to its construction, the ICR probe is sensitive to shock and comes with a protective cap for transport and handling.