Langer HR, Passive, Near Field Probes (up to 40 GHz)

Langer HR, Passive, Near Field Probes (up to 40 GHz)

The HR family consists of an H-field probe and an E-field probe for the measurement of high-frequency RF fields up to 40 GHz during development.
HR1 set
Near-Field Probes up to 40 GHz

The HR1 set contains one E-field probe HR-E 40-1 and one magnetic field probe HR-R 8-1 each for the development-accompanying measurement of magnetic and electric field in the frequency range up to 40 GHz.

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HR-R 8-1 set
Near-Field Probe Set up to 40 GHz B-field

The HR-R 8-1 set contains the HR-R 8-1 B field probe. With this probe magnetic field measurements up to 40 GHz can be performed. The special probe head of the HR-R 8-1 allows measurements on IC’s, circuit board structures and components for the localization of high frequency magnetic fields.

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HR-R 8-1
Near-field probe up to 40 GHz B-field

The HR-R 8-1 is a passive near-field probe for measuring magnetic fields up to 40 GHz.
The measuring tip is decoupled from the cable shield by special damping systems. In addition, the probe contains a current attenuator. The probe has a internal matching network to 50 ohm.

The special probe head of the HR near-field probe enables magnetic field measurements to be taken directly on IC pins or individual conductor tracks to localize B-field sources.

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HR-E 40-1 set
Near-Field Probe Set up to 40 GHz E-field

The HR-E 40-1 set contains the HR-E 40-1 E-field probe. With this field probe measurements up to 40 GHz can be performed.
The special probe head of the HR near-field probe enables measurements to be taken directly on individual conductor tracks to localize E-field sources.

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HR-E 40-1
E-Field Probe up to 40 GHz

The HR-E 40-1 is a passive near-field probe for measuring electric fields up to 40 GHz.
The measuring tip is decoupled from the cable shield by special damping systems. In addition, the probe contains a current attenuator.

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Quality features of Langer near-field probes
Overview all near-field probes Langer EMV-Technik GmbH