LF1 set

Near-Field Probes 100 kHz up to 50 MHz

The LF1 near-field probe set consists of four shielded near-field probes for measuring emissions of longwave, medium wave, and shortwave frequencies on electronic devices during the development process.
The probe heads of the LF1 set are designed for the incremental detection of electromagnetic interference sources at single pins, larger components, and on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are then used to more precisely detect any source of interference. Our near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.

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LF-R 400

H-Field Probe 100 kHz up to 50 MHz

The LF-R 400 H-field probe has a large diameter (25 mm), which makes it highly sensitive and suitable for measurements within ranges up to 10 cm around assemblies and devices.

The LF-R 400 is a passive near-field probe. With its large tip diameter (25 mm), it is more sensitive and thus is able to detect a greater area of the magnetic field than the LF-R 50 (10 mm) or LF-R 3 (3 mm) near-field probes, which both have higher resolutions than the LF-R 400. This probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.

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LF-R 50

H-Field Probe 100 kHz up to 50 MHz

The H-field probe LF-R 50 is designed to measure assemblies, devices, or cables at a distance up to 3 cm. This allows larger components to be detected as possible sources of interference.

The LF-R 50 is a passive near-field probe.

Due to its diameter, sensitivity, and resolution the LF-R 50 functions between the ranges of the LF-R 400 and LF-R 3 near-field probes.

The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.

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LF-R 3

H-Field Probe 100 kHz up to 50 MHz

The LF-R 3 near-field probe detects high resolution RF magnetic fields directly on assemblies, for example, in the area around IC pins and IC cases, conducting paths, decoupling capacitor, and EMC components.

The LF-R 3 probe is a passive near-field probe. It has the same basic construction as the LF-R 50 and LF-R 400 probes. Of these three probes, the LF-R 3 has the highest resolution. This probe is suitable for measurements close to the components in the high magnetic field strength range, but should not be used for measurements from a distance.
This can be done using LF-R 400 and LF-R 50.

The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.

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LF-B 3

H-Field Probe 100 kHz up to 50 MHz

The measuring coil of the H-field probe LF-B 3 sits orthogonally to the shaft. Using the probe tip perpendicularly ensures its correct placement directly on the assembly or device to be measured.
This allows for use at places on the surface of printed circuit boards typically hard to access, e.g. between large components of switching controllers.

The probe LF-B 3 is a passive near-field probe. The measuring coil in the LF-B 3 probe is rotated 90° in contrast to its position in the LF-R 3 probe. The LF-B 3 detects magnetic field lines emitted from the measured object at 90°. Magnetic field lines which enter the probe laterally are not detected. The near-field probe is small and handy. It has a current attenuating sheath and is, therefore, electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.

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LF-U 5

H-Field Probe 100 kHz up to 50 MHz

The H-field probe LF-U 5 is specially designed for detecting magnetic fields at wide conducting paths, cables, connectors, electronic components, cables and their connectors. The probe functions like a coupling clamp.
The LF-U 5 is a passive near-field probe. To measure, the curved underside of the probe is positioned onto the surface of components. Field lines from other sources, which enter the probe straight or laterally, are also detected.
The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.

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LF-U 2.5

H-Field Probe 100 kHz up to 50 MHz

The H-field probe LF-U 2.5 is a near-field probe. It is designed for the selective detection of RF current in conducting paths, SMD components and IC pins. The head of the probe has a magnetically active gap with a width of approx. 0.5 mm.
The LF-U 2.5 is a near-field probe. It functions like the LF-U 5 probe. While the LF-U 5 is suitable for larger components such as cable, connectors ect., the LF-U 2.5 is designed for SMD components and pins.
When measuring, the magnetically active gap of the probe head is positioned directly onto the measured object.
The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.

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LF-K 7

H-Field Probe 100 kHz up to 50 MHz

The LF-K 7 near-field probe has two coils, which detect semi-circular magnetic field lines. Such magnetic field lines occur at lines, rod-like constructional components, cable connectors, and along edges of flat constuctional components. The probe functions like a coupling clamp.
The LF-K 7 is a passive near-field probe. In contrast to the LF-U 5 probe, the LF-K 7 probe does not detect field lines entering the probe head laterally.
The near-field probe detects inhomogeneous magnetic fields which enter the bottom of the probe head through one coil, curve circularly around the head and exit through the second coil. Superposed homogeneous fields are not detected by the special probe head. The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.

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